| 摘要 |
A rapidly demountable structure for supporting electronic probes within a reactor vessel at the inner end of a dip tube element. The structure includes a fixed dip tube element which is permanently positioned in a recess at the inner end of the dip tube, and a probe supporting element selectively engaged with the dip tube element through a bayonet type interconnection. A damaged probe is replaced by first disconnecting the probe supporting element from the dip tube element, and disassembling the probe supporting element to permit removal and replacement of the probe. Means is provided to seal the opening to the reactor vessel during the period in which the probe supporting element is in disengaged condition thus affording safety to service personnel during replacement of the damaged probe.
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