发明名称 ANALYTICAL DATA PROCESSING UNIT FOR SCANNING TYPE ELECTRON MICROSCOPE
摘要 PURPOSE:To facilitate the operation of analytical data by providing a storage means that stores the quantum signals coming from a sample as picture data and making the holding formal of one-dimensional waveforms obtained by a scanning type electron microscope equal to that of two-dimensional pictures. CONSTITUTION:In picture mode, electron rays 22 are converged on a sample 25 and the sample is surface-scanned two-dimentionally by a deflection means 31. Generated quantum signals are deflected by a deflection means 27 and stored in picture memory 47 and then is displayed on a display unit 50. In addition, in waveform monitoring mode that uses a stroboscope, beams 35 are blanked by a deflection plate 33 and one-dimensional picture signals are detected and stored in parallel to the picture memory 47 as the repeating picture data. The beams are integrated by a picture data processing means including a clock generation circuit 46 and a synchronous control device 45 and averaged, and then displayed in a one-dimensional picture. As a result, by adding simple structure, an analytical data processing unit that can perform the quantitative waveform measurements and waveform display can be obtained.
申请公布号 JPS6158152(A) 申请公布日期 1986.03.25
申请号 JP19840180113 申请日期 1984.08.29
申请人 JEOL LTD 发明人 SHINKAWA TAKAAKI
分类号 H01J37/22;H01J37/28 主分类号 H01J37/22
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