发明名称 Fabrication technique for integrated circuits
摘要 A method is set forth for forming conductive contacts to first, second and third regions of a substrate. The substrate is covered with an insulating layer having a slot with an island therein. The island is covered with a first sacrificial layer. The substrate is covered with a conformal coating of a dielectric material. The coating is etched off with retention of sacrificial portions of the dielectric material between the island and the insulating layer. The first sacrificial layer is removed from the island while the sacrificial portions remain. A conductive layer is deposited upon the substrate. A second sacrificial layer is laid down upon the conductive layer. The second sacrificial layer is etched away along with the sacrificial portions of the dielectric material while the conductive layer is not significantly removed. Highly conductive contacts are provided with the conductive material self-aligned on the source, drain and gate.
申请公布号 US4577392(A) 申请公布日期 1986.03.25
申请号 US19840637449 申请日期 1984.08.03
申请人 ADVANCED MICRO DEVICES, INC. 发明人 PETERSON, DAVID R.
分类号 H01L21/336;H01L29/78;(IPC1-7):H01L21/283;H01L21/28;H01L21/56 主分类号 H01L21/336
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