发明名称 |
Method of forming electrical contact to a semiconductor substrate via a metallic silicide or silicon alloy layer formed in the substrate |
摘要 |
A silicide layer or silicon alloy layer is formed within a surface region of an impurity-doped region on the surface of a semiconductor substrate by implanting and heating any of those metals which can form silicides or silicon alloys with silicon upon heating. The peel of a metallic electrode or wiring can thus be prevented, and the electrode or wiring can be directly formed on the semiconductor substrate.
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申请公布号 |
US4577396(A) |
申请公布日期 |
1986.03.25 |
申请号 |
US19840610485 |
申请日期 |
1984.05.15 |
申请人 |
HITACHI, LTD. |
发明人 |
YAMAMOTO, NAOKI;SAKUDO, NORIYUKI |
分类号 |
H01L29/78;H01L21/265;H01L21/28;H01L21/285;(IPC1-7):H01L21/28;C23F1/02 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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