发明名称 Method of forming electrical contact to a semiconductor substrate via a metallic silicide or silicon alloy layer formed in the substrate
摘要 A silicide layer or silicon alloy layer is formed within a surface region of an impurity-doped region on the surface of a semiconductor substrate by implanting and heating any of those metals which can form silicides or silicon alloys with silicon upon heating. The peel of a metallic electrode or wiring can thus be prevented, and the electrode or wiring can be directly formed on the semiconductor substrate.
申请公布号 US4577396(A) 申请公布日期 1986.03.25
申请号 US19840610485 申请日期 1984.05.15
申请人 HITACHI, LTD. 发明人 YAMAMOTO, NAOKI;SAKUDO, NORIYUKI
分类号 H01L29/78;H01L21/265;H01L21/28;H01L21/285;(IPC1-7):H01L21/28;C23F1/02 主分类号 H01L29/78
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