| 摘要 |
PURPOSE:To make measurement simple and quick, by obtaining the ratio between the expected spectral intensity and the measured spectral intensity of each wavelength, squaring the difference between the ratio and 1, adding the squared values of the wavelengths, and obtaining the spectral rate based on the temperature and the measured spectral intensity, which make the judged value to be the minimum. CONSTITUTION:A measuring device is composed of a light converging device 7, a spectroscope 8, a photoelectric converter 9 and an electronic computer. Observed light 6 from a material to be measured comprising a near light source 1 and a background light source 2 is divided, and the measured spectral intensities of a plurality of waveforms are obtained. The spectral rate at each wavelength is approximated by the polynominal of the wavelength. The expected spectral intensity of the observed light 6 with respect to each wavelength is obtained from the approximated spectral rate. The ratio between the expected spectral intensity and the measured spectral intensity is obtained for each wavelength. The difference between the ratio and 1 is squared. The squared values are added. The temperature, at which the judged value becomes the smallest, is obtained. Based on the temperature and the measured spectral intensity, the spectral rate is obtained. Thus the stable measurement can be performed for materials to be measured in a broad range. |
