| 摘要 |
A tester for telephones and telephone answering systems features a dialing test capability for high speed dialing systems by providing the dialed digits in a single display element serially in time at a delayed rate set by strobing the digits from a memory storage element. A two-level ringing signal is provided to test for marginal telephone bell sensitivity. Means are further provided for reversing the emulation of the central office battery polarity so as to test for diode failure in electronic telephones. A simple cord circuit test for open- and short-circuit in the wall and handset cords, and moreover provides for detection of connector wiring reversal. Precision long-duration ringing burst capability is provided, along with ringback, dial tone, cut-out, and two-way communication between a telephone answering system under tests and a supplemental telephone as to provide for complete testing of the various phases of actuation of automatic answering systems.
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