发明名称 SEMICONDUCTOR WAFER DICING APPARATUS
摘要 <p>PURPOSE:To eliminate damage and mark of pressure which may be given on the surface of wafer due to the existence of wafer dusts, etc. by forming a buffer belt having wool fiber to the surface which is in contact with the wafer surface. CONSTITUTION:When dicing a wafer 1 with a semiconductor wafer dicing apparatus, a buffer belt 10 having fine wool fiber is provided between the contact surfaces in the side of surface of wafer 1 and an elastic plate 6. In case this wafer 1 is diced into small sections, it receives a pressure of curves surface body 7, the wafer layer 8 sinks into the buffer belt 10 and thereby it can be prevented that damage and marks of pressure is generated on the surface of chip diced by the curved surface body 7. The wafer 1 can be diced without generation of damage and mark of pressure and a high quality semiconductor chip can be produced on the mass production basis.</p>
申请公布号 JPS6153741(A) 申请公布日期 1986.03.17
申请号 JP19840176087 申请日期 1984.08.22
申请人 MITSUBISHI ELECTRIC CORP 发明人 OSAKA SHUICHI
分类号 H01L21/301;H01L21/78;(IPC1-7):H01L21/78 主分类号 H01L21/301
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