| 摘要 |
A test arrangement for an electronic apparatus is proposed, which can be tested by means of various, selectable programs. The electronic apparatus (10), which has a microprocessor circuit (16), is connected to an internal test device (15) which can be driven by means of an external test set (26), via the microprocessor circuit. The electronic apparatus has externally accessible contacts (18) which are connected to the test set via a connecting cable (22). The test set contains an electronics section which can be switched over and by means of which the microprocessor circuit of the electronic apparatus can be switched over to various test modes. <IMAGE>
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