发明名称 PATTERN INSPECTION DEVICE
摘要 PURPOSE:To process with high speed and to reduce a memory by scanning a memory in parallel corresponding to scanning of a picture memory. CONSTITUTION:A picture memory 1 stores a certain object pattern 0B and for this, two inspection areas A and B are set. Standard patterns A' and B' corresponding to respective inspection areas A and B are stored in a standard pattern memory 2. Then respective kinds of data are stored in standard data memory 4. The data give instructions to a scanning controller 3 to that a prescribed area (A and B) of a memory 1 and a prescribed standard pattern (A' and B') of a memory 2 can be mutually read corresponding each other. By designating a scan starting point and the area, a prescribed relation between the memories 1 and 2 is preserved and the contents can be taken out. At an operation circuit 5, concerning respective data which are read from the memories 1 and 2, for example, matching can be obtained by ''and'' operation.
申请公布号 JPS6149281(A) 申请公布日期 1986.03.11
申请号 JP19840170445 申请日期 1984.08.17
申请人 FUJI ELECTRIC CO LTD 发明人 OKI KOICHI;HORII HIROYUKI
分类号 G06T1/00;G06K9/00 主分类号 G06T1/00
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