Microwave integrated circuit test arrangement - uses L=shaped laminate contact plate centring springs for good quickly detachable contacts

摘要

A test arrangement is for flat construction integrated circuits, esp. those used in microwave applications. It uses an integrated circuit (10) holder suitable for very high frequency use ensuring pressure- and reflection- free contact and enabling rapid circuit replacement for quantity testing. The test uning housing contains circuit centering devices and a laminated earthing contact surface at the edges of a laminated board placed beneath the circuit board and connected to the housing wall via the shortest possible path. The laminates are automatically centred by attacked spring legs of L-shaped pressing against the housing walls.