发明名称 TEST AND DIAGNOSE SYSTEM OF INFORMATION PROCESSOR
摘要 PURPOSE:To realize flexible automation labor saving and high reliability by sending test diagnostic data from a test diagnostic program that an I/O control part to be tested to a two-way bus through a control part for test diagnosis. CONSTITUTION:A program is read out of a main storage device MM and executed by a CPU12. The test diagnostic control information and output data of the program are transferred to an I/O control part 14 through the two-way high- speed bus 11 and transferred to the control part 20 for test diagnosis as they are, and they are sent back to the bus 11 again and written in the MM13 again. When the writing to the MM13 is completed, an end interruption is caused from the control part 14 to the CPU12, which collect the test diagnostic control information and output data which are written in the MM13 and compares them with expected information. When their coincidence is obtained, it is decided that the control part 14 is in normal operation and the fault state of the control part 14 is therefore discriminated.
申请公布号 JPS6146536(A) 申请公布日期 1986.03.06
申请号 JP19840168958 申请日期 1984.08.13
申请人 NEC CORP 发明人 TSUCHIYA YOSHIO
分类号 G06F11/22;G06F13/00 主分类号 G06F11/22
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