| 摘要 |
The present invention relates to a bending test apparatus comprising a first bending device mounted on a vertically slidable rack. Test piece gripping means are mounted on arms attached to sector gears arranged such that when the first bending device and the rack are moved vertically downward toward the test piece, the rack engages with the sector gears so as to upwardly and inwardly swing the gripping devices. A pair of slidable devices for further bending the test piece are arranged on opposite sides of the first testing device and are adapted to converge on the test piece to further bend it after it has been previously bent by the first bending device.
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