发明名称 Method and apparatus for measuring pattern area percentage for engraving films
摘要 Apparatus for measuring pattern area percentage of engraving film with a transparent member for placing the film thereon, an optical device having a light source and light receiving unit, a moving device for relatively moving the transparent member and the optical device, and a control device which has a memory for storing the data concerning the light transmission quantities given by the optical device and a calculating device for calculating pattern area percentage corresponding to each column defined on the printing plate of a printing machine used. The number and width of columns of the printing plate varies depending on the number and spacings of ink supply keys. The control device controls the moving device which moves the placing member in the direction of each column. The optical device has a slit which width can be changed in accordance with the number and widths of ink supply keys mounted on a primary machine used.
申请公布号 US4573798(A) 申请公布日期 1986.03.04
申请号 US19820408128 申请日期 1982.08.13
申请人 TOSHIBA KIKAI KABUSHIKI KAISHA 发明人 FUJIE, HIDEO;TOGASHI, KOUSAKU
分类号 B41F33/00;(IPC1-7):G01B11/28 主分类号 B41F33/00
代理机构 代理人
主权项
地址