发明名称 SHOCK TESTER
摘要 PURPOSE:To enable to perform a test of shock at a very low temperature, by a method wherein a strike cutter is placed on a sample above which the strike cutter and a strike rod being separated from each other are set, a strike is caused by vertically dropping the strike rod supported by a bearing. CONSTITUTION:A sample 3 is set at a lower end of an SUS pipe 1 with a thick wall thickness which extends downward from an SUS flange 2, a strike cutter 4 is placed on the center of the sample 3, and a strike rod 5 is vertically dropped from an upper part to strike the cutter with the rod. A light-shielding plate 8, wherein a slit is formed, is secured to the upper part of the strike rod 5, and a photo detector 9 is positioned so that it detects light from a photo source 10 in a position allowing the strike rod 5 to drop and cut the sample 3 by strike. A shock value is found from a change in kinetic energy found from a drop speed of the strike rod 5 in case the sample is set and the drop speed of the rod from the same position in case the sample is not set. This permits testing of the shock at a very low temperature.
申请公布号 JPS587541(A) 申请公布日期 1983.01.17
申请号 JP19810105970 申请日期 1981.07.07
申请人 NIPPON GENSHIRYOKU KENKYUSHO 发明人 KATOU TERUO;TAKAMURA SABUROU
分类号 G01N3/30;(IPC1-7):01N3/30 主分类号 G01N3/30
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