发明名称 FIELD FEECT TRANSISTOR AND MANUFACTURE THEREOF
摘要 PURPOSE:To improve the accuracy of a gate electrode length by determining the length of a direction for coupling a source electrode to a drain electrode according to the thickness of a conductive layer as a laminar layer corresponding to a gate electrode. CONSTITUTION:A laminar layer 4 having a window 3 at a single crystal semiconductor substrate 1 and a single crystal semiconductor layer 9 extending from the upper surface of the layer 4 in contact with the inner surface of the window 3 on the region faced with the window 3 are formed. The layer 3 is formed of a conductive layer 5, the first electrode 16 is ohmically contacted with the substrate 1, and the second electrode 13 is ohmically contacted with the layer 9.
申请公布号 JPS587879(A) 申请公布日期 1983.01.17
申请号 JP19810105828 申请日期 1981.07.06
申请人 NIPPON DENSHIN DENWA KOSHA 发明人 HORIGUCHI KATSUJI;SUDOU TSUNETAKA;KASAI RIYOUTA
分类号 H01L29/78;H01L29/80 主分类号 H01L29/78
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