发明名称 X-ray spectrometer
摘要 An X-ray spectrometer in which, in order to increase the power of the primary X radiation projected onto a sample (1) to be analysed and/or for extending the range of wavelengths of the primary radiation, a number of X-ray tubes (19, 23) are arranged opposite to a sample holder (1a) of an X-ray spectrometer. The invention is applied in sequential X-ray spectrometers and multi-channel X-ray spectrometers. <IMAGE>
申请公布号 DE3524379(A1) 申请公布日期 1986.02.20
申请号 DE19853524379 申请日期 1985.07.08
申请人 SIEMENS AG 发明人 MOOK,BRUNO
分类号 G01N23/207;G01T1/36;H05G1/70;(IPC1-7):G01T1/36 主分类号 G01N23/207
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