发明名称 DEFECTS INSPECTION APPARATUS
摘要 PURPOSE:To display a defective part of a pattern clearly by a method wherein an inspection apparatus is composed of a detecting part which detects two patterns, a comparing which compares the detection signals and a display part which displays a pattern image in accordance with the compared result. CONSTITUTION:Two pattern signals detected by a pattern detecting part 8 are transmitted to a comparing part 11 and compared by a comparing circuit 14 by every picture element. If both signal levels conform to a prescribed relation, the pattern signals are put into a coincidence memory with a coordinate signal and if they do not, into a non-coincidence memory. A display part 17 receives the signals from the memories 15, 16 and sets different darkness signals and color signals corresponding to the picture element of coincident coordinates and the picture element of non-coincident coordinate and displays a pattern image on a monitor TV19 in accordance with those signals. With this constitution, the defective part of the pattern can be clearly displayed and corrected easily and accurately.
申请公布号 JPS59231811(A) 申请公布日期 1984.12.26
申请号 JP19830105719 申请日期 1983.06.15
申请人 HITACHI DENSHI ENGINEERING KK;HITACHI SEISAKUSHO KK 发明人 NAKAUNE HIDEHIKO;NARAOKA KIYOTAKE
分类号 G01N21/88;G01N21/956;H01L21/027;H01L21/30;H01L21/66;(IPC1-7):H01L21/30;G01N21/00 主分类号 G01N21/88
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