LEAKAGE-RATIO TESTING METHOD CONDUCTING TEMPERATURE COMPENSATION,申请号JP19850085583-传众专利搜索

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发明名称	LEAKAGE-RATIO TESTING METHOD CONDUCTING TEMPERATURE COMPENSATION
摘要
申请公布号	JPS6134435(A)	申请公布日期	1986.02.18
申请号	JP19850085583	申请日期	1985.04.23
申请人	ANTAARESU ENG INC	发明人	SEMON BUREIMAN;RONARUDO ENU BAROTSUKU
分类号	G01M3/26;G01M3/32	主分类号	G01M3/26
代理机构		代理人
主权项
地址

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