| 摘要 |
PURPOSE:To improve an inspection accuracy and to shorten an inspection time by comparing a position data for showing a pattern center coordinate from a pattern collating circuit, and a key top center coordinate from a cell center position detecting circuit, by a position shift detecting circuit. CONSTITUTION:From a cell center position detecting circuit 13 for detecting a center coordinate of a key top from an output of an image cutting circuit 8, and a position data for showing a center coordinate of a standard pattern outputted from a pattern collating circuit 11, a position shift detecting circuit 14 detects a relative position of both of them. A pattern deciding circuit 12 discriminates coincidence or dissidence of a pattern by a collating data of a pattern outputted from the pattern collating circuit 11, a position shift data outputted from a position shift detecting circuit 14, and a position shift tolerance data 15 registered in advance in the pattern deciding circuit 12. In this way, by providing the cell center detecting circuit 13 and the position shift detecting circuit 14, even if it is decided to be the same pattern, a key top whose semantics is different depending on in which position of the key top the pattern exists can be discriminated easily. |
