| 摘要 |
PURPOSE:To measure laser oscillation wavelength by shaping light from a semiconductor laser into a parallel beam and comparing the position where an image is formed through a diffraction grating with the position where the light from the LD is image-formed by the same means. CONSTITUTION:The pitch P of a modulating signal is set to an optional value between 1/10-1sec according to the specifications of a data logger 13 and an XY recorder 16 in use. The laser light emitted by the LD is modulated with the modulating signal 9 and a constant electric current is flowed to a Peltier element 5 during said period to raise the ambient temperature of the LD from, for example, 25 deg.C to 40 deg.C; and the ambient temperature is detected by a thermistor 6 and the wavelength is detected by a position sensor 3, so that outputs of the both are drawn on the data logger 13 or XY recorder 16. Consequently, temperature characteristics of the oscillation frequency and wavelength stepping of an LD to the inspected and the influence of image frequency on them are measured. |
