| 摘要 |
PURPOSE:To perform high-precision thickness detection by providing an M-scale counter in front of a display counter, radiating an ultrasonic wave to the same inspection point N times, and counting a clock corresponding to a reflected wave at every time and displaying the grand total result. CONSTITUTION:A transmitting and receiving probe 2 is arranged on the surface of a material 1 to be inspected. A pulser 3 is excited to generate an ultrasonic wave, which propagates in the material 1 to be inspected and is reflected by the bottom surface, so that the reflected wave is received by the probe 2. The received signal is supplied to a receiving amplifier 4 and a comparing circuit 5b the set number N of times of measurement with the actual number of times of measurement. The number N of times indicates the frequency of the measurement of the ultrasonic thickness meter which is performed while the measurement position of the object material 1 is fixed. A gate circuit 5a receives the output of the amplifier 4 and outputs a pulse signal setting a clock counting section to the M-scale counter 8a when the number of times of measurement at the same measurement position is less than N. Decimal counters 8b-8d count the output of a counter 8a to make a decimal 3-digit display on display circuits 10a-10c. Thus, the high-precision thickness detection is performed. |
