| 摘要 |
According to the present invention, there is disclosed a microprocessor for a sewing machine which can be changed over from a normal service mode for controlling sewing operations to a diagnostic mode for controlling diagnostic programs. The drive of the diagnostic programs takes place by actuation of already present selector switches of the sewing machine and the display of the diagnostic results takes place through already present displays of the sewing machine. In order to facilitate the diagnostic, a mask is provided which can be placed on the control and displaying panel of the sewing machine and which contains indications relating to the drive of determined programs and the reading of the results. At least in one case, means are provided in order to enter and store correcting information according to the results of the diagnostic. This provides a simple and multilateral diagnostic capability and the possibility of intervention in the electronics of the sewing machine.
|
