TESTING METHOD OF ELECTRONIC DEVICE

摘要

PURPOSE:To reduce the number of developing processes of a test program by using a time chart outputted from a CAD of an electronic device or that manually formed at the time of design or appreciation of the input data and correct answer data for a device to be tested. CONSTITUTION:At a testing time, a time chart 14 is read out by a line computer 12. Various time chart data are stored in the line computer 12 and its contents are sent to an optical bus 11 in accordance with a request. A testing machine 4 receives necessary data through a bus adaptor 8 and stores the data in a memory device 9. The data corresponding to the time chart and stored in the memory device 9 are sent to an input interface 2 of the device 1 to be tested through a connector 10 and data on an output interface 3 are inputted to the memory device 9. The memory device 9 compares the input data with the previously stored correct answer data to determine the data to be sent successively.