发明名称 DETECTION OF END POINT OF DEVELOPMENT
摘要 PURPOSE:To eliminate the unstableness and non-efficiency in the detection of the end point of photoresist development by connecting a connecting means consisting of a metallic material to a metallic film through the resist of an exposed substrate to make one electrode, using a material consisting of a metallic material different from said metallic material as the other electrode and dipping said material into a developing soln. CONSTITUTION:The developing soln. 2 consisting essentially of, for example, sodium hydroxide, is incorporated in a vessel 1 and the substrate 3 consisting of, for example, silicon, disposed with, for example, an aluminum layer 21 deposited by evaporation and a photoresist (photoresist 23 and unexposed photoresist 22) completed of an exposing stage on the aluminum layer and a platinum wire 4 are dipped in the soln. 2. The aluminum wire provided with a holder 5 at the top end is brought into contact with the aluminum layer on the substrate 3 by breaking through the resist film to make one electrode and the wire 4 is used as the other electrode in order to monitor the progressing condition of the development by the soln. 2 in the exposed part 23 on the substrate 3. Lead wires 7a and 7b are connected to the respective top ends of the aluminum wire 6 and the platinum wire 4 and are connected to an amplifier 9.
申请公布号 JPS6120043(A) 申请公布日期 1986.01.28
申请号 JP19840140551 申请日期 1984.07.09
申请人 SHIGUMA GIJUTSU KOGYO KK 发明人 KANDA KAORU;KANDA KUNIHIKO
分类号 G03F7/30;G03F7/00;H01L21/027;H01L21/30 主分类号 G03F7/30
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