发明名称 MAGNETRON WORKING POINT MEASURING APPARATUS
摘要 PURPOSE:To simplify measuring work by providing a magnetron on a waveguide for impedance measurement by making phase difference between an antenna of said magnetron and an outside antenna of a measurement apparatus to be integral times of one half of guide wavelength. CONSTITUTION:An outside antenna 5 has the same output part construction with a magnetron, which performs measurement, and is provided outwardly projected at one end of a square wave guide 4 while an inside antenna 6 connects the outside antenna 5 and the square wave guide 4 in the way of a microwave. The microwave enters a directional corrector 9 while passing through the connection holes 10 and 11 for being divided into an incident wave and a reflection wave. The magnetron 12 is attached to the connection hole 8 of the square wave guide for being fixed to an electron range 2. Phase difference between the outside antenna 5 and the antenna 13 is set up to be integral times of one half of guide wavelength. Thereby, a working point on the Smith chart is equal to the case where the magnetron is directly connected to the wave guide of the electron range.
申请公布号 JPS6168833(A) 申请公布日期 1986.04.09
申请号 JP19850150131 申请日期 1985.07.10
申请人 HITACHI LTD 发明人 ISHIDA YOSHIO;FURUTAKI YOSHIO
分类号 G01R31/24;H01J25/50;(IPC1-7):H01J25/50 主分类号 G01R31/24
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