| 摘要 |
PURPOSE:To estimate simultaneously both common and decentralized factors of a device fault by giving the integrated decision to the reliability of observation of signs, the probability with conditions where the sign is observed and the negative information. CONSTITUTION:A sign reliability geometric average producer 20 produces the geometric average of observation reliability of a sign; while a conditional probability producer 24 produces the condition probability. At the same time, an arrival possibility searching device 25 searches the arrival possibility to a factor from the sign. Then the outputs of producers 20 and 24 and the device 25 are multiplied by each other for calculation of the load of a fault mode. A load order deciding device 32 arranges the fault modes in the order of larger load and decides a fault mode of the largest load as the fault factor. Thus it is possible to estimate simultaneously both common and decentralized factors of a device fault. |
