ON CHIP SELF-CHECKING ARRANGEMENT FOR VLSI CIRCUIT AND BUILT-IN (ON-CHIP) SELF-CHECKING DEVICE FOR VLSI MEMORY CIRCUIT

摘要

PURPOSE: To arrange a data pattern generator on the same chip as a super LSI circuit in order to generate specified deterministic inspection data applied to the data input of the super LSI circuit. CONSTITUTION: A deterministic data pattern generator 80 is provided on a super LSI chip, and detects a chip module and acts in such a way as to impart a pass/fail result along with data for identifying a failure generated place. This position data is collected to be used next time and made available. A built-in inspection circuitry can prepare a program and is provided with a looping function for the improvement of burn-in inspection or the like.