发明名称 PROCEDIMIENTO PARA FORMAR UN DISPOSITIVO QUE INCLUYE UNA RE GION DE UN OXIDO DE SILICIO
摘要 <p>Conformal layers of a silicon oxide, such as silicon dioxide, are deposited at temperatures below 600 degrees C through the decomposition of compounds such as diacetoxyditertiarybutoxysilane. The required temperatures do not significantly affect temperature-sensitive structures. Therefore, it is possible to form silicon oxide regions in the processing of devices having these structures.</p>
申请公布号 ES545000(D0) 申请公布日期 1986.01.16
申请号 ES20000005450 申请日期 1985.07.09
申请人 AMERICAN TELEPHONE & TELEGRAPH COMPANY 发明人
分类号 C23C16/40;H01L21/316;(IPC1-7):H01L21/205 主分类号 C23C16/40
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