| 摘要 |
PROBLEM TO BE SOLVED: To provide a pattern positioning device and method in which the relative positions of two picture data corresponding to two pattern pictures can be exactly positioned. SOLUTION: Prescribed feature points A and B in a pattern are extracted in each first block BK1 in a reference picture data 100, vectors A1, A2, B1, and B2 from those feature points A and B to a reference position P are calculated, and a feature point/vector table 300 indicating the corresponding relation of each feature point with the vectors is prepared. The feature points A and B are extracted in each second block BK2 of picture data 200 to be inspected, pixel positions indicated by the corresponding vectors A1, A2, B1, and B2 from each feature point A and B in the second block BK2 are calculated by referring to the feature point/vector table 300, 1 is added to the corresponding elements of a count matrix 400, and pixel positions corresponding to elements having the maximum count values of the count matrix 400 are detected. |
