发明名称 Optoelectronic method and apparatus for measuring the bending angle of materials
摘要 To achieve a greater accuracy, an optoelectronic measuring method and an apparatus for measuring with optoelectronic instruments provides that one or two light rays of one or two light transmitters, such as lasers, are directed at an acute angle onto a surface to be shaped and that the distance covered from the starting position to the end position in the shaping operations is measured by means of a photodetector, e.g., a diode camera, which is set up perpendicular to the light spot or spots.
申请公布号 US4564765(A) 申请公布日期 1986.01.14
申请号 US19830489852 申请日期 1983.04.29
申请人 MENGELE & SOEHNE MASCH KARL 发明人 BLAICH, MICHAEL
分类号 B21D5/02;G01B11/16;G01B11/26;(IPC1-7):G01B/ 主分类号 B21D5/02
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