发明名称 FORMATION OF INSULATION FILM
摘要 PURPOSE:To enable the chemical vapor phase deposition of an insulation film containing phosphorus on the surface of a III-V group compound semicondutor at a temperature of 500 deg.C or lower by reacting both raw material gases introduced in a reaction container, one containing phosphorus and the other containing nitrogen. CONSTITUTION:A raw material gas containing phosphorus and a raw material gas containing nitrogen are inroduced in a reaction container 1, these raw material gases are reacted and an insulating macromolecular film containing (PON)n and (P2O2N3H3)n is chemically vapor-phase-deposited on the surface of a III-V group compound semiconductor 6 containing phosphorus. For example, using a reaction tube 1 made of quartz, ammonia diluted with argon is introduced in the reaction tube 1 from an inlet 3, POCl3 at a room temperature bubbled with argon and diluted with argon is introduced in the reaction tube 1 from an inlet 4 and a macromolecular film containing (PON)n and (P2O2N3H3)n is chemically vapor-phase-deposited on a substrate 6 by heating the InP substrate 6 to 360 deg.C.
申请公布号 JPS613412(A) 申请公布日期 1986.01.09
申请号 JP19840123765 申请日期 1984.06.18
申请人 NIPPON DENSHIN DENWA KOSHA 发明人 FURUKAWA YOSHITAKA
分类号 H01L29/78;C23C16/06;H01L21/318 主分类号 H01L29/78
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