发明名称 DEVICE FOR DETECTING INCIDENCE POSITION OF SECONDARY ELECTRONS
摘要 PURPOSE:To enable the incidence position of secondary electrons to be detected with high accuracy by causing the secondary-electron-discharging surface of a final stage dynode to have uniform sheet resistivity and connecting electrodes for supplying a current to the final stage dynode to it thereby producing positional signals. CONSTITUTION:Photoelectrons produced by photons becoming incident upon a photoelectric screen 2 are intensified by a transmission-type dynode group 3 before becoming incident upon a final stage dynode 5. Since the secondary- electron-discharging surface of the dynode 5 has uniform sheet resistivity, the signal outputs produced by electrodes 11, 12, 13 and 14 contain information about the incidence positions of the intensified secondary electrons. The outputs of charge amplifiers 21 and 22 are connected to an adder 25 and a subtractor 26 and the output terminals of the adder 25 and the subtractor 26 are connected to a divider 27. The output of the divider 27 is represented by the signal of the X-axis on the coordinates.
申请公布号 JPS612253(A) 申请公布日期 1986.01.08
申请号 JP19840122639 申请日期 1984.06.14
申请人 HAMAMATSU HOTONIKUSU KK 发明人 TAKEUCHI JIYUNICHI;KUME HIDEHIRO;MURAMATSU SHINICHI;IIDA MASAHIRO
分类号 H01J43/18;H01J43/04;H01J43/22 主分类号 H01J43/18
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