| 摘要 |
PURPOSE:To effect a probe test in a short time easily by arranging a member for wiring shortage and a wiring for shortage previously on a mother chip. CONSTITUTION:A material for wiring shortage for probe test 5 and a wiring 6 are arranged on a mother chip 2 thereby shortening the all wirings 4. The member 5 is formed with a little smaller area than that of a semiconductor chip 3. Nextly a terminal 7 of a measuring device is brought in contact with wiring terminals P1 - P2, P2 - P3, P1 - P3... to effect the energizing test of those. After the energizing of those is confirmed, the part designated by a dot and dash line A, i.e., a part of the wiring 6 is removed to prevent the energizing among the wirings. By thus arranging the member 5 and the wiring 6 previously on the chip 2, the probe test can be made in a short time easily. |
