| 摘要 |
A station for testing one or more electric conductors (8) covered in insulating material (9) includes one or more contact probes (14) movable to pierce the insulation and contact the conductors (8). Additionally one or more contact pins (12), resiliently mounted in a mounting (11) are movable to engage and electrically connect with one free end of the exposed conductors (8). A voltage set up between the contact probes (14) and the one or more contact pins (12) provides an indication of whether the contact probes have made an electrical connection with their respective conductor. The probes (14) are circular with a circumferential cutting edge (15). They may conveniently be moved to pierce the insulating material (9) by rotation of their mounting (16) about the axis of the conductor under the action of a cam follower (17) on a cam profile (18). |
