| 摘要 |
<p>Magazines (12) each loaded, in series, with IC elements to be tested are stacked, and such stacked magazines are arranged in columns. The lowermost magazines of the stacked magazines of the respective columns are simultaneously brought down by a takeout mechanism (55) onto a magazine receiver (61,62), and the magazines on the magazine receiver are simultaneously but intermittently fed by intermittent stepping means (63) in the direction of their arrangement. The outermost one of the magazines on the magazine receiver is loaded at an IC elment receiving position. The IC elements from the magazine are supplied to a testing station, wherein they are tested, and the tested IC elements are sorted in a sorting station according to their test results and respectively then loaded into IC element receiving magazines in an accumulating station. The accumulating station has an IC receiving magazine stocker room in which IC element receiving magazines are stacked, and an empty magazine stocker room in which empty magazines are stacked. The empty magazines are taken out, one by one, by takeout and loading means from the empty magazine stocker room and each empty magazine is loaded at the position of a selected IC receiving magazine from under it pushing it up in the IC element receiving magazine stocker room. </p> |
