发明名称 |
METHOD AND DEVICE FOR ANALYSING A MICROWAVE RADIATION BEAM |
摘要 |
The invention refers to the analysis of a very high frequency radiation beam of electromagnetic waves. According to the invention, a network of conductor wires is placed in the path of a beam to be analyzed, the wires being interrupted at intervals by switches. One controls the conducting state of a diode and one blocks the others and one makes the position of the diode vary electronically and sequentially in the conducting state. The return signal received on a sensor R is used by detecting the significant characteristics of that return according to the position of the diodes in the conducting state. |
申请公布号 |
DE3267537(D1) |
申请公布日期 |
1986.01.02 |
申请号 |
DE19823267537 |
申请日期 |
1982.05.05 |
申请人 |
SOCIETE D'ETUDE DU RADANT |
发明人 |
SADONES, HENRI |
分类号 |
G01R29/10;(IPC1-7):G01R29/10 |
主分类号 |
G01R29/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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