发明名称 METHOD FOR FORMING CHAGE STORGE NODE OF CAPACITOR
摘要 PURPOSE: A method for forming a charge storge node of a capacitor is to increase the capacitance using a TaON thin film. CONSTITUTION: The charge electrode node(30) is formed with a doped silicon layer and an oxide layer(40) is formed on the entire structure by using O3. Afer that, an SiON layer(50) is formed by using NH3 reaction gas in a plasma atmosphere. A TaON thin layer(60) is deposited on the SiON layer(50) by a surface chemical reaction. Therefore, achieving a desired capacitance.
申请公布号 KR20010008517(A) 申请公布日期 2001.02.05
申请号 KR19990026393 申请日期 1999.07.01
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, TAE HYEOK;PARK, DONG SU
分类号 H01L27/108;H01L21/02;H01L21/314;H01L21/321;H01L21/8242;(IPC1-7):H01L27/108 主分类号 H01L27/108
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