发明名称 |
METHOD FOR FORMING CHAGE STORGE NODE OF CAPACITOR |
摘要 |
PURPOSE: A method for forming a charge storge node of a capacitor is to increase the capacitance using a TaON thin film. CONSTITUTION: The charge electrode node(30) is formed with a doped silicon layer and an oxide layer(40) is formed on the entire structure by using O3. Afer that, an SiON layer(50) is formed by using NH3 reaction gas in a plasma atmosphere. A TaON thin layer(60) is deposited on the SiON layer(50) by a surface chemical reaction. Therefore, achieving a desired capacitance.
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申请公布号 |
KR20010008517(A) |
申请公布日期 |
2001.02.05 |
申请号 |
KR19990026393 |
申请日期 |
1999.07.01 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
LEE, TAE HYEOK;PARK, DONG SU |
分类号 |
H01L27/108;H01L21/02;H01L21/314;H01L21/321;H01L21/8242;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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