发明名称 POSITIVE TYPE RESIST COMPOSITION
摘要 PROBLEM TO BE SOLVED: To provide a positive type electron beam or X-ray resist composition having high resolving power and a positive type electron beam or X-ray resist composition having high sensitivity as well as high resolving power. SOLUTION: In the positive type electron beam or X-ray resist compositions each containing (A) a compound which generates an acid when irradiated with electron beams or X-rays and (B1) a low molecular dissolution inhibiting compound having a group which can be decomposed by the action of the acid, having solubility in an alkali developing solution increased by the action of the acid and having a molecular weight of >1,000 to 3,000, the dissolution inhibiting compound has a structure formed by combining two or more triphenylmethane structures in an unconjugated state in a part where the group which can be decomposed by the action of the acid is not present.
申请公布号 JP2001312055(A) 申请公布日期 2001.11.09
申请号 JP20010028335 申请日期 2001.02.05
申请人 FUJI PHOTO FILM CO LTD 发明人 ADEGAWA YUTAKA;SHIRAKAWA KOJI
分类号 G03F7/004;C07C39/15;C07C39/17;C08K5/00;C08K5/134;C08L101/00;H01L21/027 主分类号 G03F7/004
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