发明名称 Chip scale package
摘要 A process for forming a true chip scale package comprising the sandwiching of a silicon wafer with a large number of identical die therein between top and bottom metal contact plates of the same size as the wafer. The sandwich is secured together as by soldering, and the die and contact plates are singulated in the form of a final chip scale package. The edge of each chip may have an insulation band formed thereon. Slots may be formed in the top contact to define, with the edge saw cuts, a separate contact area on each top contact.
申请公布号 US6396091(B2) 申请公布日期 2002.05.28
申请号 US20010840439 申请日期 2001.04.23
申请人 INTERNATIONAL RECTIFIER CORPORATION 发明人 EWER PETER R.
分类号 H01L21/50;H01L23/051;H01L23/10;(IPC1-7):H01L29/76;H01L29/94;H01L31/062;H01L31/113;H01L31/119 主分类号 H01L21/50
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