发明名称 Process and device for qualitative and quantitative measurement of irregularities and impurities on and in transparent or semitransparent flexible sheet materials
摘要 Disclosed is a process for the qualitative and quantitative measurement of irregularities and impurities on and in transparent or semitransparent flexible sheet materials, comprising the steps of producing interference fringes by obliquely directing a light beam onto the surface of a sheet to be examined to produce two partial beams; placing the sheet to be examined on a reflecting reference surface and forming the partial beams by reflection from this reference surface and from the surface to be examined; superposing the two partial beams, whereby an interference field is obtained which is equivalent to the surface profile of the sheething to be examined; evaluating the interference field to determine the extension of the surface profile; additionally irradiating the sheet by a polarized light beam; passing the polarized light beam through a second polarizer; and evaluating the polarized light beam after passing through the second polarizer. Also disclosed is an apparatus for carrying out this process.
申请公布号 US4560277(A) 申请公布日期 1985.12.24
申请号 US19830493758 申请日期 1983.05.11
申请人 HOECHST AKTIENGESELLSCHAFT 发明人 MONZER, HELMUT
分类号 G01N21/89;(IPC1-7):G01B9/02 主分类号 G01N21/89
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