发明名称 |
Process and device for qualitative and quantitative measurement of irregularities and impurities on and in transparent or semitransparent flexible sheet materials |
摘要 |
Disclosed is a process for the qualitative and quantitative measurement of irregularities and impurities on and in transparent or semitransparent flexible sheet materials, comprising the steps of producing interference fringes by obliquely directing a light beam onto the surface of a sheet to be examined to produce two partial beams; placing the sheet to be examined on a reflecting reference surface and forming the partial beams by reflection from this reference surface and from the surface to be examined; superposing the two partial beams, whereby an interference field is obtained which is equivalent to the surface profile of the sheething to be examined; evaluating the interference field to determine the extension of the surface profile; additionally irradiating the sheet by a polarized light beam; passing the polarized light beam through a second polarizer; and evaluating the polarized light beam after passing through the second polarizer. Also disclosed is an apparatus for carrying out this process.
|
申请公布号 |
US4560277(A) |
申请公布日期 |
1985.12.24 |
申请号 |
US19830493758 |
申请日期 |
1983.05.11 |
申请人 |
HOECHST AKTIENGESELLSCHAFT |
发明人 |
MONZER, HELMUT |
分类号 |
G01N21/89;(IPC1-7):G01B9/02 |
主分类号 |
G01N21/89 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|