发明名称 GRADE CLASSIFYING METHOD OF FLAW DETECTING DEFECT
摘要 PURPOSE:To derive exactly a grade classification of the JIS standard of a flaw detecting defect by using a manual ultrasonic flaw detecting device, placing a flaw detector on a flaw detecting material, placing a flaw detecting data on a reference material, obtaining a reference data, and applying them to a data processor. CONSTITUTION:A flaw detecting data is obtained by a flaw detector against a weld line 12 of a flaw detecting material 10. In this case, the flaw detector 24 is moved to an X axis 21 and a Y axis 22, and a scan is executed. Subsequently, data of a beam path and an echo height are obtained by an ultrasonic flaw detector 30, and recorded in a data recording device (a cassette, etc.) 40. Also, data of the X axis 21, the Y axis 22, etc., and a reference data obtained in advance are stored in the cassette 40. Subsequently, said data are inputted to a data processor 50, a distance amplitude characteristic of the reference data is derived, and from said characteristic and the flaw detecting data, a point data and a line data are derived with regard to a defective part. A length of the defect is derived from the line data, and also a grade of the defect of the JIS standard is classified from each data of an area of an echo height and a plate thickness. Accordingly, the grade of the defect can be classified by the flaw detecting data and the reference data.
申请公布号 JPS60257356(A) 申请公布日期 1985.12.19
申请号 JP19840113950 申请日期 1984.06.05
申请人 TATEISHI DENKI KK 发明人 ISHIDA ISAMU;KATSUMATA KANEYOSHI
分类号 G01N29/11;G01N29/44 主分类号 G01N29/11
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