发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 PURPOSE:To facilitate the control of a wafer and the discrimination of pellets by each mounting detecting circuits flowing currents among one or more of input terminals and a power supply line and providing a means selectively connecting the detecting circuits and each input terminal. CONSTITUTION:When detecting circuits A are fitted to n input signal terminals, 2<n> kinds of pellets can be discriminated. When n=2 is held, a VDD terminal is brought previously to input terminals M, N, and not less than 4VT voltage is applied. Consequently, the combinations of terminals, through which current flow, differ by pellets ( I, II, III or IV) as shown in the table 1. Pellets of four kinds can be discriminated by reading the combinations A O represents the flowing of current and an x no-flowing of currents in the table 1. Accordingly, since data at every level can be separated and taken not only on measurement under the state of a wafer but also on selection after assembly by introducing program steps for discriminating pellets at the beginning of a measuring program, trouble in which the control of the wafer at every level and pellets are discriminated through visual observation and separated can be omitted.
申请公布号 JPS60257555(A) 申请公布日期 1985.12.19
申请号 JP19840114206 申请日期 1984.06.04
申请人 NIPPON DENKI KK 发明人 ISHIOKA HIROSHI
分类号 H01L27/04;H01L21/66;H01L21/822;H01L21/8234;H01L27/088 主分类号 H01L27/04
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