发明名称 Cleaaning solution and cleaning process using the solution
摘要 (1) A cleaning solution for semiconductor substrates comprising an oxidizing agent, an acid and a fluorine compound, having a pH adjusted in the range of 3 to 10 by addition of a basic compound and having a concentration of water of 80% by weight or greater, (2) a cleaning solution for semiconductor substrates comprising an oxidizing agent, an acid, a fluorine compound and a corrosion inhibitor, having a pH adjusted in the range of 3 to 10 by addition of a basic compound and having a concentration of water of 80% by weight or greater, and a process for cleaning semiconductor substrates having metal wiring which comprises cleaning with the cleaning solution, are provided. The cleaning solution can completely remove residues of etching on semiconductor substrates in a short time, does not corrode copper wiring materials and insulation film materials, is safe and exhibits little adverse effects on the environment.
申请公布号 SG129274(A1) 申请公布日期 2007.02.26
申请号 SG20040000573 申请日期 2004.02.10
申请人 MITSUBISHI GAS CHEMICAL COMPANY, INC. 发明人 MATSUNAGA HIROSHI;OHTO MASARU;YAMADA KENJI;SHIMIZU HIDEKI;TSUGANE KEN;OGUNI SEIKI;KIMURA YOSHIYA
分类号 H01L21/304;C11D3/00;C11D3/02;C11D3/20;C11D3/30;C11D3/32;C11D3/37;C11D3/39;C11D7/08;C11D7/10;C11D7/26;C11D7/30;C11D7/32;C11D11/00;H01L21/306;H01L21/321 主分类号 H01L21/304
代理机构 代理人
主权项
地址