发明名称 ETCHING METHOD
摘要 PURPOSE:To prevent contamination on an etching surface and damage of a substrate to be treated due to ion-bombardment, by irradiating light onto the surface of the substrate to be treated and at the same time by supersonic-vibrating the substrate. CONSTITUTION:Chlorine atmosphere is kept in a chamber 11. Ultraviolet rays UV are projected on a substrate 15 to be treated through an ultraviolet ray transmitting window 12 from a mercury-arc lamp etc. to react the surface of a silicon layer with reacting gas. In this case, the substrate 15 is supersonic-vibrated by a supersonic vibrator 20 which is engaged with stage 16 to scatter reaction product from the surface being etched, so that the silicon surface can be always exposed to the etching area. In this way, the etching rate can be increased considerably.
申请公布号 JPS60254619(A) 申请公布日期 1985.12.16
申请号 JP19840109947 申请日期 1984.05.30
申请人 FUJITSU KK 发明人 ITOU TAKASHI
分类号 C23F1/12;H01L21/302;(IPC1-7):H01L21/302 主分类号 C23F1/12
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