发明名称 CALIBRATING APPARATUS AND METHOD OF MARKING FOR LASER MARKING SYSTEM
摘要 A calibrating apparatus and a method a laser marking system is provided to control marking according to a size of a gap generated in a height of a chip inside a tray. A calibrating apparatus and a method a laser marking system includes a detecting part(1) and a marking part(2). The detecting part includes a vision camera(3) and a laser beam oscillator(4). The vision camera photographs X, Y position of chips(11) mounted on a tray(10) by detecting laser beam irradiated to a side of the chips mounted on the tray. The laser beam oscillator detects a position in a height direction by irradiating a laser beam to the side of the chips mounted on the tray. The marking part marks letters and/or figures on the chips.
申请公布号 KR100771496(B1) 申请公布日期 2007.10.30
申请号 KR20060040017 申请日期 2006.05.03
申请人 VIS CO., LTD. 发明人 LEE, DAE HEE
分类号 B23K26/18 主分类号 B23K26/18
代理机构 代理人
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