发明名称 TESTING SYSEM OF MEMORY FUNCTION
摘要 PURPOSE:To shorten especially a test time, and to realize the reduction of a test cost with regard to a large capacity memory, without losing the significance of GALWRS, by selecting a GALWRS pattern of a Gallup write/read system, in ''0'' - the maximum address of a reference address, inhibiting the selection of other jump destination address to the minimum of a Hamming distance 1, and executing a test. CONSTITUTION:''0'' (or ''1'') is written in all addresses, and subsequently, an operation test by a GALWRS pattern is executed to a jamp address (ADJ) for selecting separately a reference address (ADT) with regard to ''0'' address through the maximum address. The selection of the ADJ is a Hamming distance 1 in ''0'' - the maximum address. The number of total steps of the test goes to all addresses W0/W1(N)+all ADT(N)Xlog2NX16, and the test necessary time is shortened to T=200X10<-9>X16X2<16>Xlog22<16>=3.36S by substituting N=2<16> of a conventional example and a cycle time 200ns of a memory.
申请公布号 JPS60253099(A) 申请公布日期 1985.12.13
申请号 JP19840109935 申请日期 1984.05.30
申请人 FUJITSU KK 发明人 FUKUDA TAKATOSHI
分类号 G01R31/28;G11C29/00;G11C29/10 主分类号 G01R31/28
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