发明名称 SWEEP DEVICE OF OVERLAY FIELD MASS SPECTROGRAPH
摘要 PURPOSE:To sensitively detect daughter ions by sweeping at a low speed the voltage Vdx to generate an electric field and the magnetic-field strength Bx independently or jointly in accordance with a predetermined relational equation and repeatedly sweeping Vdx at a high speed within a range of a micro width. CONSTITUTION:A sweep circuit 12 calculates the overlay electric-field voltage Vdx in accordance with a predetermined relational equation, and it feeds an obtained signal specifying Vdx to an electric-field power supply 9 through an adding circuit 14 and also feeds a signal specifying the magnetic-field strength Bx to a magnetic-field power supply 7. On the other hand, the sweep circuit 13 calculates DELTAVdx proportional to Vdx at this time, and it multiplies the obtained DELTAVdx by the AC signal fed from an oscillator 15 to generate an AC signal with an amplitude of DELTAVdx, this AC signal is fed to the adding circuit 14 to be added to Vdx and fed to the electric-field power supply 9, thereby a zigzag high-speed sweep is performed, thus ions existing within a range of a micro width including daughter ions are periodically converged and detected.
申请公布号 JPS60250548(A) 申请公布日期 1985.12.11
申请号 JP19840105944 申请日期 1984.05.25
申请人 NIPPON DENSHI KK 发明人 NAITOU NORIHIRO
分类号 G01N27/62;H01J49/02;H01J49/32 主分类号 G01N27/62
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