发明名称 MARKING METHOD FOR SEMICONDUCTOR DEVICE
摘要 PURPOSE:To improve the marking quality and the marked appearance by marking on the molding surface formed by the lower die. CONSTITUTION:With a semiconductor pellet 5 fixed to the tab 4 of a lead frame turned upward, the lead frame 3 is sandwiched between the sealing upper die 1 and the lower die 2. Then, the titled device sealed with a resin 7 is produced by pushing the resin into a die space 6. Thereafter, a molding surface 7a in contact with the upper die 1 is turned downward, and a molding surface 7b in contact with the lower die upward, and these surfaces are marked with trade marks, trade names, etc. Since the marked surface is the molding surface formed by the lower die, the dirt of the lower die can be easily recognized and removed at the time of resin sealing; accordingly, the high marking quality and excellent appearance of the titled device are enabled.
申请公布号 JPS6190447(A) 申请公布日期 1986.05.08
申请号 JP19840212102 申请日期 1984.10.09
申请人 NEC CORP 发明人 MORISHIGE TOSHIO
分类号 H01L23/00;H01L23/544 主分类号 H01L23/00
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