| 摘要 |
PCT No. PCT/SE82/00390 Sec. 371 Date Jul. 22, 1983 Sec. 102(e) Date Jul. 22, 1983 PCT Filed Nov. 19, 1982 PCT Pub. No. WO83/01852 PCT Pub. Date May 26, 1983.The present invention relates to a method for comparison between a first optical signal ( PHI 1) and at least one other signal. The invention can for instance be used for image recognition. In this application it is a problem to be able to perform parallel processing of the content of an image. This problem among others is solved in connection with the invention by illuminating a MIS-structure (11; FIG. 1) with the first optical signal ( PHI 1), which creates an optically induced change in the surface potential of the MIS-structure and by influencing the surface potential also by said at least one other signal by illuminating the MIS-structure (11; FIG. 1) with a second optical signal ( PHI 2) or by applying the signal in the form of a voltage across the structure or by providing the structure with charge in the insulator or its interfaces or by a combination of these methods and by varying at least one of all signals as a function of time. |
