发明名称 HIGH PLACE INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a high place inspection device of photographing a structure located at a high place in the vicinity thereof.SOLUTION: A high place inspection device includes: a pole 2 having a freely expandable and contractible configuration; a photographic unit support part 3 having the longitudinal direction, which is connected to the upper part of the pole 2 at substantially right angle; and a photographic unit 4 which is capable of moving along in the longitudinal direction of the photographic unit support part 3 and photographing in the downward direction.SELECTED DRAWING: Figure 1
申请公布号 JP2016090762(A) 申请公布日期 2016.05.23
申请号 JP20140224005 申请日期 2014.11.04
申请人 OOBITTO:KK 发明人 MATSUMOTO HIROTO
分类号 G03B17/56;E01F9/60;E01F9/623;E01F9/658;E01F9/696;F16M11/24;G03B15/00;H04N5/222;H04N5/225;H04N5/232 主分类号 G03B17/56
代理机构 代理人
主权项
地址